Acutance Scientific Ltd for Electron Probe EPMA, IMS SIMS, 3D Atom Probe Tomography, innovative Electron Microscopy techniques and 3D Optical Profiling
Acutance Scientific - innovative compositional analysis, electron microscopy and 3D profiling
Out in front
Acutance Scientific brings the most innovative tools in compositional analysis to the market. From mapping the full distortion tensor and Geometrically Necessary Dislocations at the Electron Microscope resolution to 3D Atom Probe Tomography, here is a combination of instruments of the future and quality/performance benchmarks.It is only possible to give a very limited presentation of the capabilities of these instruments on this website - please contact us for further details.
Understanding your project and experiment
Our first objective is always to understand the experimental aim and requirements for a desired project. Our second objective is to provide you with all the information you need to make your own informed evaluation. If we don’t think we can recommend a solution we’ll say so and aim to point you in the direction of somebody who can. With considerable experience of the techniques, data deliverables and the hidden pitfalls for the unwary, our main aim is to ensure that any solution recommended really does the job. A long track record in compositional analysis instrumentation design for nanotechnology helps too. If you think your desired experiment in our technical neck of the woods is impossible, then run it past us before drawing any conclusions......